Minutes of the CLIC Meeting - 21 March 2003
|Effect of target emitted ions on the focal
spot of an intense electron beam and impact on drive beam profile monitors
CLIC manpower plan 2003-2008
| C. Vermare
(CEA), Thibaut Lefevre, Ian Wilson
C. Vermare (CEA) and Thibaut Lefevre presented
their work on the 'Effect of target emitted ions on the focal spot of an
intense electron beam and impact on drive beam profile monitors'
A limitation in the use of intercepting profile monitors for high intensity
electron beams like those needed for the drive beams of CLIC and CTF3
are the Ions released from the heated target, which lead to further focusing
of the beam with the risk of damaging the target itself or blowing up the
beam. This adversely affects the beam size measurement.
Some experimental results obtained on induction linacs both in France
and in the US together with simulations will be shown, indicating a very
good agreement with experimental data. The result of simulations for the
CTF3 drive beams will be discussed as well. The design of the CTF3 beam profile
monitor and the chosen strategy for their safe use will be finally given.
copy of Christophe's transparencies (pdf format)
copy of Thibaut's transparencies (pdf format)
Ian Wilson presented the CLIC manpower plan.
copy of his transparencies (pdf format)
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Tecker - Last updated 31-03-2003